The NAP-XPS represents a revolution in the field, allowing for XPS characterization of a sample in a gaseous environment. This is achieved by containing the sample in a high pressure cell which is only open to the analyzer via a small aperture. A series of pumping stages after this aperture quickly reduce the pressure back down to high vacuum and limits the distance the electrons have to travel through a high pressure of gas. By placing the surface of the sample very close to this aperture, the area under analysis can be in a high pressure of gas whilst also allowing a useable fraction of the emitted photoelectrons to escape and reach the detector.
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