HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE

High-resolution transmission electron microscopy uses accelerated high-energy electrons to penetrate thin samples and microscopically image the material through electromagnetic lens. This TEM can achieve different acceleration voltages of 80-300 kV, and the point resolution can reach 0.205 nm. Equipped with an X-ray energy   spectrometer (resolution better than 136 eV)，which can make the rapid analysis of  the chemical composition of the sample. It also coupled with an electron energy loss   spectrometer (resolution better than 0.7 eV), which enables fine analysis of electronic structure etc.