ATOMIC FORCE MICROSCOPE-BASED INFRARED SPECTROSCOPY (AFM-IR)

The Anasys Instruments nanoIR2 system includes an Atomic Force  Microscope (AFM) which can scan the sample and generate topography  images of the sample. In addition, the nanoIR2 uses a pulsed, tunable   IR source to excite molecular absorption in a sample. As the sample  absorbs radiation, it heats up, leading to a local rapid thermal expansion  of the sample. The rapid thermal expansion is sensed by the AFM  cantilever due to the pulses exciting resonant oscillations of the  cantilever.