ATOMIC FORCE MICROSCOPE

Atomic force  microscopy  (AFM) is one  kind of observation  method that  takes advantage of the atomic force between the probe and the sample  surface . AFM is a powerful technique that enables the imaging of material   surface in atomic scale. It has the advantage of imaging almost any type of  surface, including polymers, ceramics, glass, and biological samples. Beside   topography analysis, AFM can work in different modes in order to study the   electrical /magnetic and mechanical properties of material.