The environmental spherical aberration-corrected transmission electron microscope can simulate the working conditions of the material under a certain gas environment and characterize the dynamic behavior of the microstructure. Gases currently available include, but are not limited to, hydrogen, oxygen, carbon dioxide, argon and nitrogen. In addition, through specially designed sample holder, the material's response to specific conditions such as liquid, pressure, electrical stimulation, heating, cooling, etc. can be observed in real time. The TEM is also equipped with a spherical aberration corrector that achieves very high spatial resolution (0.1 nm). This TEM can operate with acceleration voltages of 80,200 and 300 kV.
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