DOUBLE ABERRATION CORRECTED TRANSMISSION ELECTRON MICROSCOPE

The double aberration corrected transmission electron microscope is equipped with two spherical aberration correctors, which can   improve the resolution of the electromagnetic lens in the transmission mode and the scanning transmission mode with a resolution   of better than 60 pm. The TEM is equipped with four high-efficiency X-ray spectrum detectors for atomic-level chemical composition   analysis. The monochromator and electron energy loss spectrum enable the characterization of the optical properties, electronic   structure and atomic environment of the local region of the material with ultra-high resolution. This TEM also enables three-dimensional reconstruction of materials in transmission, scanning transmission and energy spectrum modes. Besides, Lorentz, differential phase contrast and holography are available as well. This TEM can operate in the 60-300 kV.